The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2001

Filed:

Mar. 08, 1999
Applicant:
Inventors:

An-Hung Tan, Ping-Chen, TW;

Chi-Chih Chen, Chu-Pei, TW;

Han-Ming Wang, Hsin-Chu, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B44C 1/22 ; C03C 1/500 ; C23F 1/00 ; B24B 4/900 ;
U.S. Cl.
CPC ...
B44C 1/22 ; C03C 1/500 ; C23F 1/00 ; B24B 4/900 ;
Abstract

The present invention provides a texture measuring method of a hard disk plate. The method comprises performing a laser etching process to form a pinhole at each of a plurality of predetermined positions in a predetermined area on the hard disk plate, measuring the pinhole at each of the predetermined positions to obtain a first measurement value, performing a mechanical texturing process on the predetermined area of the hard disk plate to form circular textures on the predetermined area, and measuring the pinhole at each of the predetermined positions to obtain a second measurement value wherein the first and second measurement values are used to determine the extent of texturing performed on the predetermined area of the hard disk plate.


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