The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2001
Filed:
Feb. 19, 1999
David W. Sokol, Dublin, OH (US);
Craig T. Walters, Powell, OH (US);
Harold M. Epstein, Columbus, OH (US);
Allan H. Clauer, Worthington, OH (US);
Jeffrey L. Dulaney, Dublin, OH (US);
Mark O'Loughlin, Galloway, OH (US);
LSP Technologies, Inc., Dublin, OH (US);
Abstract
A method and apparatus for quality control of laser shock processing. The method includes measuring emissions and characteristics of a workpiece when subjected to a pulse of coherent energy from a laser. These empirically measured emissions and characteristics of the workpiece are correlated to theoretical shock pressure, residual stress profile, or fatigue life of the workpiece. The apparatus may include a radiometer or acoustic detection device for measuring these characteristics.