The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2001

Filed:

Sep. 21, 1999
Applicant:
Inventors:

Maw-Chwain Lee, Taipei, TW;

Yu-Tang Yang, Tao Yuan, TW;

Fun-Yeuan Hwang, Tao Yuan, TW;

Yuen-Liang Chen, Tao Yuan, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/08 ;
U.S. Cl.
CPC ...
G01N 1/08 ;
Abstract

An automatic sampling method and facility are disclosed, by means of which multiple samples are obtained from a closed container filled with heterogeneous solid material. The sampling points are predetermined and well distributed on the container and the sampling position and depth in the container are selected by a special controller of the sampling system. The system can be operated at an open space for non-radioactive material. The obtained samples are collected and blended in a mixer for homogenization treatment to produce a final specimen for analytical measurement. The homogeneous specimen is well accepted for its representative character.


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