The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2001

Filed:

Jun. 12, 2000
Applicant:
Inventors:

An-Keun Peter Lee, East Greenwich, RI (US);

Michael R. Williams, West Kingston, RI (US);

Todd E. Whitaker, East Lyme, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 1/26 ;
U.S. Cl.
CPC ...
G01L 1/26 ;
Abstract

An apparatus for measuring the force applied to a thin-line towed array having a towed array hose formed as part of a thin-line towed array. Coupling components divide the interior of the towed array hose into compartments. Axial tension measurement devices are located within one compartment, and bend measurement devices are located in another compartment. These measurement devices are electrically connected to a digitization and encoding module which is in turn connected to a processing device for providing measurements of the forces on the array.


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