The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2001
Filed:
Nov. 25, 1998
William Baxter Joyce, Basking Ridge, NJ (US);
Ronald Edward Scotti, White House Station, NJ (US);
Lucent Technologies Inc., Murray Hill, NJ (US);
Abstract
A method for nondestructively and accurately determining the stress of a fabricated semiconductor chip soldered, brazed or otherwise bonded to a submount using optical microscopy and finite element analysis. Deformations on a top surface of the semiconductor chip are first examined using optical microscopy. The deformations are then correlated using finite element analysis to the stress on the semiconductor chip caused by the soldering process. If the stress is determined to be within an acceptable range of measurement, then the semiconductor chip will have been properly soldered to the submount and can be used.