The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2001

Filed:

Aug. 20, 1999
Applicant:
Inventors:

Michael J. Danyluk, Cincinnati, OH (US);

Richard E. Klaassen, West Chester, OH (US);

Michael E. Keller, Mason, OH (US);

Assignee:

General Electric Company, Cincinnati, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/904 ;
U.S. Cl.
CPC ...
G01N 2/904 ;
Abstract

An ultrasonic inspection element and method are provided for improved ultrasonic inspection of curved entry surface parts. The transducer element may be spherically focused, or have a flat surface. The transducer/mirror element combination is used to inspect through a concave or convex surface. A mirror element shapes the sound beam relative to the shape of the curved surface of the part being inspected. Curvature of the mirror is adjusted with a screw, rod, voltage modulator, or other suitable adjustment mechanism. An alternative mechanism includes multiple “quick disconnect” interchangeable curved mirror elements.


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