The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2001
Filed:
Jul. 09, 1998
Christopher McCall Durham, Austin, TX (US);
Peter Juergen Klim, Austin, TX (US);
Ronald Gene Walther, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and system for detecting faults within dual-rail complementary logic circuits. A method and system are disclosed for detecting faults within dual-rail complementary logic circuits. A dual-rail complementary logic circuit is coupled to an associated complementary fault detection circuit within an integrated circuit. Thereafter, the presence of a non-complementary logic signal can be detected at an output of the complementary fault detection circuit, in response to providing an input signal at an input of the dual-rail complementary logic circuit, such that the presence of a non-complementary logic signal at an output of the complementary fault detection circuit indicates the presence of a fault within the associated complementary logic circuit.