The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2001

Filed:

Oct. 29, 1998
Applicant:
Inventors:

Brian P. Fin, Thornton, CO (US);

Daniel J. Dixon, Thornton, CO (US);

Assignee:

Hewlett Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/100 ;
U.S. Cl.
CPC ...
G06F 1/100 ;
Abstract

A system for testing a microprocessor having a core execution unit, an internal memory, and a data port may comprise a tester having a data port which is connected to the microprocessor data port. A test vector generator program is transferred from the tester to the internal memory of the microprocessor for testing the microprocessor when the test vector generator program is executed by the core execution unit. The test vector generator program generates test vectors which are also stored in the internal memory, and which may then be executed by the core execution unit.


Find Patent Forward Citations

Fin, Brian. (2001). System and method for testing a microprocessor with an onboard test vector generator (U.S. Patent No. 6253344). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6253344

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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