The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2001
Filed:
Feb. 22, 1999
Neil Ray Vanderschaaf, Round Rock, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and system for automatically maintaining data consistency across two or more hierarchically arranged databases is disclosed. A master list and an environmental variable file are created for use in maintaining the data consistency of a cell view. A cell view in a selected database is then checked to see if it has been modified by performing date-time stamp shadowing. If the cell view is modified, the cell view is then retrieved by derivative lists created from the master list and the environmental variable file and translated based on criteria from the environmental variable file. Verification is then performed on the translated cell view once again based on criteria from the environmental variable file. This verification creates a signature for the translated cell view. Signatures are then checked for being out of date with respect to any dependency listing contained internally. Any signature found to be out of date triggers an automatic re-verification of the pertinent data file. The translated and verified cell view is then checked to see if it or any of its dependencies have been altered by performing an audit based on criteria from the environmental variable file using the signature. The translated and verified cell view is then promoted to a higher quality database based on the results of the audit.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile