The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2001
Filed:
Mar. 25, 1997
Eric S. Buckley, Scarborough, CA;
Bruce W. C. Lee, Markham, CA;
Branko Bukal, Toronto, CA;
Wayne G. Dawe, Richmond Hill, CA;
Andrew G. Noonan, Oshawa, CA;
Todd R. Richardson, Scarborough, CA;
Image Processing Systems, Inc., Ontario, CA;
Abstract
Apparatus and methods for system and method for testing and aligning a CRT which can sequentially perform all of the tests needed to precisely align the CRT and provide real-time feedback for operator adjustments. The system can integrate each of the measurements and automatically verify measurements previously performed as required. An improved color CCD camera is also provided which can maintain focus irrespective of variations in the thickness and glass curvature of the CRT screen. Further, photodiode optical filter and lens assemblies and wobulator assemblies can be incorporated into the system to further improve the testing and aligning of the CRTs.