The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2001

Filed:

Apr. 07, 1999
Applicant:
Inventors:

Maged F. Barsoum, Sunnyvale, CA (US);

Hungming Chang, Cupertino, CA (US);

Eugen Gershon, San Jose, CA (US);

Chien-Meen Hwang, San Jose, CA (US);

Muoi V. Huynh, San Jose, CA (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 9/06 ;
U.S. Cl.
CPC ...
H03K 9/06 ;
Abstract

A method and apparatus for detecting a sinusoidal signal samples a received signal. An error signal generator receives at its inputs two previous samples of the signal and a current sample of the signal and generates an error signal based on these previous and current samples. A comparison circuit compares the generated error signal for the current sample to an error threshold value and generates a threshold comparison signal that indicates whether the generated error signal is below the error threshold value. A determination circuit then determines whether the received signal is a sinusoidal signal based on the threshold comparison signals that are generated for a plurality of samples.


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