The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2001

Filed:

Oct. 06, 1998
Applicant:
Inventors:

Nobuaki Takeuchi, Tokyo, JP;

Yoshiki Yanagisawa, Tokyo, JP;

Jun Kikuchi, Tokyo, JP;

Yoshio Endou, Tokyo, JP;

Mitsuru Shinagawa, Tokyo, JP;

Tadao Nagatsuma, Tokyo, JP;

Kazuyoshi Matsuhiro, Tokyo, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/03 ; G04F 1/302 ; G01R 1/334 ;
U.S. Cl.
CPC ...
G02F 1/03 ; G04F 1/302 ; G01R 1/334 ;
Abstract

The present invention relates to an electro-optic sampling oscilloscope in which an electric field generated by a signal to be measured is coupled with an electro-optic crystal, and an optical pulse outputted from an optical pulse output circuit is caused to enter the electro-optic crystal, and the waveform of the signal to be measured is observed using the polarization state of the optical pulse. The optical pulse output circuit has as the input light thereof a sample optical pulse amplified by an optical amplifier circuit, and outputs, as an optical pulse, the output from an optical filter which blocks the propagation of the spontaneously emitted light of the optical amplifier circuit.


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