The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2001
Filed:
Oct. 28, 1998
Applicant:
Inventors:
Mikio Kimura, Ageo, JP;
Akihiko Fujita, Ageo, JP;
Assignee:
Mitsui Mining & Smelting Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/135 ;
U.S. Cl.
CPC ...
G01N 2/135 ;
Abstract
The refraction type non-destruction measuring apparatus of the present invention has a prism having a predetermined refractive index, projecting means for projecting near infrared light onto an object to be examined through the prism, a contact material filling the space between the object to be examined and the prism and having a refractive index set in conformity with the characteristic of the object to be examined, and light receiving means for receiving the internal reflected light of the light having entered the interior of the object to be examined through the contact material and the prism.