The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2001

Filed:

Apr. 28, 1999
Applicant:
Inventors:

Akihiko Harada, Tokyo, JP;

Takayuki Saito, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/1314 ; H01L 2/14763 ;
U.S. Cl.
CPC ...
H01L 2/1314 ; H01L 2/14763 ;
Abstract

There is described a method of manufacturing a semiconductor device for the purpose of preventing damage to a lower wiring layer, wherein wiring elements of dual damascene structure are formed on the lower wiring layer. Under the method, a first silicon nitride film, a first silicon oxide film, a second silicon nitride film, and a second silicon oxide film are formed, in this sequence, on a lower wiring layer. A via hole is formed at a position above the lower wiring layer so as to pass through the second silicon oxide film and the second silicon nitride film. A photoresist is embedded into the via hole so as to cover the internal wall surface thereof. After formation of a protective film from the photoresist, predetermined portions of the second silicon oxide film and the second silicon nitride film are removed, thus forming a wiring trench.


Find Patent Forward Citations

Loading…