The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2001
Filed:
Feb. 02, 1999
Simultaneous measurement of gene expression and genomic abnormalities using nucleic acid microarrays
Yijia Bao, Naperville, IL (US);
Diping Che, Westmont, IL (US);
Wan-Liang Li, Lisle, IL (US);
Uwe Richard Müller, Plano, IL (US);
Steven A. Seelig, Naperville, IL (US);
Jufang Shi, Hinsdale, IL (US);
Vysis, Inc., Downers Grove, IL (US);
Abstract
The invention comprises a multi-color, comparative hybridization assay method using an array of nucleic acid target elements attached to a solid support for the simultaneous detection of both gene expression and chromosomal abnormalities in a tissue sample. The method of the invention employs a comparative hybridization of a tissue mRNA or cDNA sample labeled in a first fluorescent color, a tissue chromosomal DNA sample labeled in a second fluorescent color, and at least one reference nucleic acid labeled in a third fluorescent color, to the array. The fluorescent color presence and intensity at each of at least two target elements are detected and the fluorescent ratios (i) of the first and third colors and (ii) the second and third colors determined. Gene expression and chromosomal abnormalities are thus simultaneously detected.