The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2001
Filed:
May. 13, 1998
Ben A. Hitt, Wheeling, WV (US);
Other;
Abstract
An adaptive fuzzy feature mapping (AFFM) technique provides a method for identifying and matching a new data pattern against a set of known data patterns using a combination of distance measurements and fuzzy logic functions. Known data patterns are stored as organized nodes in a pattern map wherein each organized node is defined by one or more attribute coefficients. As distance measurement is computed between a new data pattern and each organized node of the pattern map using distance measurement wherein the organized node having the smallest distance measurement to the new data pattern receives the highest ranking. Traversing the organized nodes according to the ranking, the new data pattern is compared to each organized node using fuzzy logic functions. If the new data pattern matches an organized node based on an acceptable degree of fuzziness, the attribute coefficients of the organized node are updated to reflect those coefficients of the new data pattern. If the new data pattern does not match any of the organized nodes in the pattern map, a new organized node is created in the pattern map representing the attribute coefficients of the new data pattern.