The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2001

Filed:

Feb. 02, 1998
Applicant:
Inventors:

Thomas David Green, late of Warks, GB;

Janko Mrsic-Flogel, London, GB;

Zorislav Sojat, Zagreb, HR;

Assignee:

Symmetricom, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/900 ; G01R 2/100 ;
U.S. Cl.
CPC ...
G06F 1/900 ; G01R 2/100 ;
Abstract

Apparatus for measuring the phase of a predetermined incoming data sequence comprising, sampling means operable under control of a sampling clock to sample the incoming sequence at a frequency not equal to an integer multiple or divisor of the data rate of the sequence, test means operable to record a plurality of the samples in a time-ordered sequence, reference means operable to store a copy of at least a portion of the predetermined digital data sequence, comparison means operable to compare the recorded and stored sequences over a predetermined sequence length and to locate the position of an additional or omitted sample in the recorded sequence, calculation means operable to calculate the time of sampling of the additional sample or the time of sampling of the omitted sample relative to the sampling clock, and output means operable in response to the calculated time of sampling, to output a phase value indicative of the phase relative to the sampling clock, of the incoming sequence.


Find Patent Forward Citations

Loading…