The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2001

Filed:

Feb. 06, 1998
Applicant:
Inventors:

Hidetaka Yuri, Yokkaichi, JP;

Kiyokazu Kurihara, Yokkaichi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/900 ;
U.S. Cl.
CPC ...
G06F 1/900 ;
Abstract

Method and apparatus for optimizing a work distribution, and in particular, to the optimization of work distribution along an assembly line or in a production process. A difficulty level is set for each task to be performed and a skill level is set for each respective worker. A time variation factor is set based upon the ranked work difficulty and the skill level of the workers. A compensation value is provided in accordance with the worker to whom an operation time of each element work is distributed, based upon a time variation factor. An assigned operation time per worker is maintained in equilibrium among respective workers by distributing each task in a preferential order, based on the compensated operation time.


Find Patent Forward Citations

Yuri, Hidetaka. (2001). Method and apparatus for optimizing work distribution (U.S. Patent No. 6249715). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6249715

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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