The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2001
Filed:
Oct. 05, 1998
Yoshiaki Kuroda, Ishikawa-ken, JP;
Komatsu Ltd., Tokyo, JP;
Abstract
In a machine tool for performing cutting work of a work employing a tool provided with at least one throw away tip, abnormality of the tip C can be certainly detected by picking up tips C,C,, . . . Cn of the tool by means of image pick-up means,providing different image processes for the obtained image, obtaining a luminance value distribution data of an inspecting region set at a cutting edge portion of the tip, and performing interpolation processing between the images for the obtained luminance value distribution data to take out only a luminance value of a defective portion Cc of the inspecting region and to detect abnormality of the tip C,C,, . . . Cn on the basis of the luminance value. Thus, abnormality of the tip C can be certainly detected even when a stain is deposited.