The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2001
Filed:
Dec. 22, 1997
Albert E. Chu, Hillsborough, CA (US);
Lian Tao, San Francisco, CA (US);
EY Laboratories, Inc., San Mateo, CA (US);
Abstract
A method and system for automatic analysis of a testing substrate for an analyte in a liquid sample. The sample is applied to a testing substrate having an immobilized thereon, in a limited region of the testing substrate, a receptor capable of binding to the analyte. A labeled reagent, capable of binding to the analyte, is added to the testing substrate. If the analyte is present, a color is generated at the area of the testing substrate where the receptor is immobilized. The testing substrate is then illuminated and, using electronic equipment a digital image of the testing substrate is acquired and automatically scanned to locate an area of the testing substrate having the highest color density and generating a first measurement of color density. Next, an area peripheral to the area of highest color density is located and a second measurement of color density is generated. This peripheral area represents tho background density of the substrate, which can be considered to be the background “noise”. The presence or absence of the analyte in the liquid sample is calculated by adjusting the first measurement with said second measurement in accordance with a predefined mathematical function.