The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2001

Filed:

Sep. 23, 1999
Applicant:
Inventor:

Yuji Okamoto, Kanagawa, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 1/606 ;
U.S. Cl.
CPC ...
G11C 1/606 ;
Abstract

A nonvolatile memory device for which an endurance test can be performed in a short time without requiring an apparatus for exclusive use for generating a reference current. The nonvolatile memory includes a memory cell for holding binary data and outputting, upon reading therefrom, first current or second current which is lower than the first current in response to the binary data, a reference circuit for generating reference current lower than the first current but higher than the second current, a sense amplifier for comparing the output current of the memory cell with the reference current to reproduce binary data, and a reference switching circuit for selectively switching the reference current to be generated by the reference circuit to a normal current, a higher current which is higher than the normal current or a lower current which is lower than the normal current.


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