The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2001
Filed:
Jun. 29, 1999
Joshua M. Cobb, Victor, NY (US);
Robert J. Zolla, Rochester, NY (US);
Jeffrey R. Hawver, Rochester, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
A method of detecting the relative skew between a reference beam and transparent lenticular material of the type having a repeating pattern of cylindrical lenses, comprising the steps of: forming a beam of light; focusing the beam of light into a line with a width smaller than the pitch of the cylindrical lenses onto the lenticular material; moving the lenticular material relative to the beam in a direction such that the beam crosses the longitudinal axes of the cylindrical lenses to modulate the angle of reflection or refraction of the beam of light; and sensing the position of the line of modulated beam of light along a line parallel to the longitudinal axes of the cylindrical lenses to determine the skew or relative angular location of lenticular material to the focused line.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile