The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2001
Filed:
Sep. 30, 1999
Donald W. Davies, Torrance, CA (US);
Mark Slater, Manhattan Beach, CA (US);
Richard A. Hutchin, Calabasas, CA (US);
TRW Inc., Redondo Beach, CA (US);
Abstract
An improved lateral shearing interferometer system for use with an original optical wavefront and a displaced optical wavefront having a phase difference from the original optical wavefront is disclosed. It comprises a lateral shearing interferometer that responds to the original optical wavefront and the displaced optical wavefront and develops an optical interference pattern representative of the optical phase differences. An optical detector located at the focal plane of the optical interference pattern provides a selective array of electrical signals representative of separated portions of the interference pattern. A data processor is programmed to indicate the separated portions of said interference pattern, which has pixels in non-adjacent locations in odd rows and no pixels in even rows. The pixels correspond to locations of actuators for correcting the phase difference.