The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2001

Filed:

Oct. 29, 1999
Applicant:
Inventors:

Gary Wang, Santa Rosa, CA (US);

Peter Egerton, Santa Rosa, CA (US);

Kenneth R. Wildnauer, Santa Rosa, CA (US);

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/10 ;
U.S. Cl.
CPC ...
G01J 1/10 ;
Abstract

Wavelength reference standard using multiple gasses and calibration methods using same. A wavelength reference using absorption lines of multiple gasses provides stable reference wavelengths over multiple regions of interest of the optical spectrum. The gasses may be in separate cells or combined in one cell. Improved calibration using the reference is achieved by performing calibration measurements at a plurality of known wavelengths and using an average calibration constant derived from the plurality of measurements. In a second embodiment, improved calibration is achieved by performing calibration measurements at a plurality of known wavelengths and calculating a higher order calibration model, such as a least-squares linear fit. Both approached may be extended by segmenting the wavelength range and using calculated calibration values for each segment.


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