The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2001
Filed:
Mar. 15, 1999
Lei Wang, Sunnyvale, CA (US);
Weizhong Wang, Mountain View, CA (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
The present invention compactly fabricates integrated circuits of an electronic system on a semiconductor wafer by fabricating the integrated circuits of the electronic system on both sides of a semiconductor wafer. A first face of an area of the semiconductor wafer is processed with an integrated circuit fabrication process step to fabricate part of a first integrated circuit thereon. In addition, a second face of the area of the semiconductor wafer is processed with the integrated circuit fabrication process step to fabricate part of a second integrated circuit thereon. The first face and the second face are processed for a plurality of integrated circuit fabrication process steps until the first integrated circuit is completely fabricated on the first face and the second integrated circuit is completely fabricated on the second face. The first face and the second face of the area of the semiconductor wafer may both be processed simultaneously or may be processed one face at a time depending on the fabrication process step. That area of the semiconductor wafer is then cut from the rest of the semiconductor wafer such that the first integrated circuit and the second integrated circuit are on a die to be used within an electronic system. The present invention may be used to particular advantage when the first integrated circuit includes at least one processor and when the second integrated circuit includes at least one processor. In that case, the die having the first integrated circuit and the second integrated circuit is used within a multiprocessor system. With the present invention, integrated circuits of an electronic system are compactly fabricated onto both sides of a semiconductor wafer.