The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2001
Filed:
Jan. 26, 1999
Homayoon S. M. Beigi, Yorktown Heights, NY (US);
Stephane H. Maes, Danbury, CT (US);
Jeffrey S. Sorensen, Seymour, CT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for computing a distance between collections of distributions or finite mixture models of features. Data is processed so as to define at least first and second collections of distributions of features. For each distribution of the first collection, the distance to each distribution of the second collection is measured to determine which distribution of the second collection is the closest (most similar). The same procedure is performed for the distributions of the second collection. Based on the closest distance measures, a final distance is computed representing the distance between the first and second collections. This final distance may be a weighted sum of the closest distances. The distance measure may be used in a number of applications such as [speaker classification,] speaker recognition and audio segmentation.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile