The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2001

Filed:

Oct. 01, 1998
Applicant:
Inventors:

Kenneth L. Cockerham, Milford Township, Bucks County, PA (US);

Stephen B. Krasulick, Fogelsville, PA (US);

Thomas F. Strelchun, Mertztown, PA (US);

Paul K. Tallat-Kelpsa, Maidencreek Township, Berks County, PA (US);

Anthony J. Wiencek, Rockland Township, Berks County, PA (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C01D 2/100 ; H04N 5/38 ;
U.S. Cl.
CPC ...
C01D 2/100 ; H04N 5/38 ;
Abstract

In a test configuration for a pre-distortion board configured with an analog laser, a test operator adjusts the settings for one or more components (e.g., potentiometers) on the pre-distortion board, e.g., to optimize the linearity of the analog laser, relying on information contained in a graphical display presented on a computer monitor. In one embodiment, a signal generator generates electrical signals, the pre-distortion board distorts the electrical signals, the analog laser converts the distorted electrical signals into optical signals, an optical receiver converts the optical signals back into electrical signals, a band-pass filter filters the converted electrical signals, an RF spectrum analyzer generates amplitude vs. frequency data from the filtered electrical signals, and a computer generates the graphical display from the amplitude vs. frequency data, wherein the graphical display has a bar graph that graphically and textually indicates the current distortion level of the analog laser relative to a distortion requirement level and an extreme distortion level for the current test.


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