The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2001
Filed:
Aug. 19, 1998
Norbert Conrads, Raeren, BE;
Martin Weibrecht, Aachen, DE;
Ulrich Schiebel, Aachen, DE;
Herfried K. Wieczorek, Aachen, DE;
U.S. Philips Corporation, New York, NY (US);
Abstract
An x-ray examination apparatus comprises an x-ray image sensor matrix (,) for deriving an initial image signal from the x-ray image. The sensor elements of the x-ray sensor matrix convert incident x-rays into electric charges. These electric charges are read-out and converted into the initial image signal. Further a correction unit (,) is provided for correcting the initial image signal, notably for disturbances due to delayed transferred charges, that have been retained in the sensor elements for some time. The correction unit (,) is provided with a memory which stores correction values. Further the correction provided with a selection unit (,) for selecting appropriate correction values from the memory (,).