The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2001
Filed:
Aug. 25, 1998
Applicant:
Inventors:
Rudolph T. Kopp, III, Hartland, WI (US);
Hui David He, Waukesha, WI (US);
George E. Seidenschnur, Waukesha, WI (US);
Paul C. Schanen, Waukesha, WI (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/300 ;
U.S. Cl.
CPC ...
G01N 2/300 ;
Abstract
The present invention, in one form, is an imaging system which, in one embodiment, alters the configuration of a detector array and a data acquisition system to determine degraded component performance and generate fault isolation information. More specifically, by altering the configuration to include different combinations of detector array cells, interconnections, and one or more data acquisition channels, fault isolation information is generated.