The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2001

Filed:

Dec. 04, 1998
Applicant:
Inventors:

Atsushi Kikukawa, Higashimurayama, JP;

Sumio Hosaka, Nishitama-gun, JP;

Hajime Koyanagi, Koshigaya, JP;

Kimitoshi Etoh, Hachioji, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 3/90 ; G11B 3/00 ;
U.S. Cl.
CPC ...
G11B 3/90 ; G11B 3/00 ;
Abstract

A recording and reproducing or observing apparatus based on a laser beam deflection detection method in which an object has a very small area for reflecting light. A laser beam emitted by a semiconductor laser diode passes through a collimator lens and a stop. The beam passes through the lens and stop and is reflected by a polarization beam splitter and focused by an objective lens onto a surface of a cantilever. Reflected light from the cantilever surface is focused by the lens before being received by a position sensor. Either the incident light or the reflected light passes through an optical path that is substantially 90 degrees relative to the optical axis of the other light.


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