The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2001
Filed:
Dec. 02, 1999
BAE Systems plc, Farnborough, GB;
Abstract
Disclosed is an apparatus and method for inspecting or testing a sample using shearography techniques. A laser shearing interferometer includes: a source of coherent radiation, a line generator producing a line of coherent radiation from said source, a line scanner scans the line of coherent radiation over the sample, a shearing element generates two laterally displaced images of the sample, and phase stepper or ramper steps or ramps the phase of one of the two images. A video camera views images of the sample and provides corresponding video output signals. An image processor receives the video output signals and extracts therefrom the frame rate of the camera in substantially realtime. A signal generator provides the stepper and the line scanner, a signal substantially in phase with the frame rate of the camera, a decoder is used for phase extraction and a vacuum chamber contains the laser shearing interferometer and the sample under test. A pressure control varies the pressure within the vacuum chamber between several predetermined pressure values and a control unit interfaces and synchronizes the processor, the signal generator, the decoder and the pressure control.