The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2001
Filed:
May. 25, 1999
Sydney George Chapman, Winchester, GB;
Andrew Gordon Neil Walter, Winchester, GB;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A reticle for an object measurement system comprises a pattern,having a plurality of pairs of contrasting elements in the form of black (,) and white (,) wedges. Each black/white wedge pair defines a path towards a pattern origin,such that an edge of an object,occluding the path causes a change in contrast adjacent an edge point along the path. The pattern has a series of Gray-coded elements,associated with each pair of black/white wedges. The Gray-coded elements are indicative of an absolute coordinate of each edge point at which an object edge crosses a path. A series of triangles,associated with each pair of black/white wedges, whose absolute coordinates are known, allow a measurement system to provide accurate coordinates for each edge point.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile