The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2001

Filed:

Jul. 17, 1998
Applicant:
Inventors:

Nobuhiro Kambe, Tokyo, JP;

Akihiro Abe, Yokohama, JP;

Takanori Shimada, Tokyo, JP;

Go Nakano, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

A map editing apparatus is provided with various sections having respective editing functions which can be selectively specified for operating on one or more user-selected elements of a displayed map, with each editing function serving to automatically execute a specific editing operation, which may utilize one or more predetermined parameters. The apparatus includes a conformity management section having a function for detecting when execution of an editing operation will result in nonconformity in the map, such as mutual overlapping of map elements, and for automatically causing such an editing operation to be executed in a modified form, such as to prevent occurrence of the nonconformity.


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