The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2001

Filed:

Mar. 12, 1999
Applicant:
Inventors:

Toshichika Sakai, Tokyo, JP;

Takaharu Fujii, Tokyo, JP;

Yasuo Yashiba, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03H 1/126 ;
U.S. Cl.
CPC ...
H03H 1/126 ;
Abstract

In a semiconductor device capable of obtaining an optimum delay time, a plurality of delay circuits are connected in series to one another through points of connections between two adjacent ones of the delay circuits to produce a plurality of reference delay signals derived from the delay circuits. One of the reference delay signals is decided as the optimum delay time with reference to a practical condition. Thus, the delay time can be varied in the semiconductor device.


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