The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2001

Filed:

Apr. 07, 1999
Applicant:
Inventors:

Maged F. Barsoum, Sunnyvale, CA (US);

Hungming Chang, Cupertino, CA (US);

Eugen Gershon, San Jose, CA (US);

Chien-Meen Hwang, San Jose, CA (US);

Muoi V. Huynh, San Jose, CA (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 2/500 ;
U.S. Cl.
CPC ...
G01R 2/500 ;
Abstract

A method and apparatus for detecting a sinusoidal signal samples a received signal. An error signal generator receives at its inputs a previous sample of the received signal and a current sample of the received signal and generates an error signal based on these previous and current samples. A comparison circuit compares the generated error signal for the current sample to an error threshold value and generates a threshold comparison signal with a first value that indicates the generated error signal is below the error threshold value for a second value that indicates a generated error signal is above the error threshold value. A determination circuit then determines whether the received signal is a sinusoidal signal based on a threshold comparison signal generated for a plurality of samples. The determination circuit includes a counter that maintains a count of the number of threshold comparison signals having the first value within a sampling period.


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