The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2001
Filed:
May. 11, 1998
Patrick Leteurtre, Montpellier, FR;
Frédéric Ossart, Nimes, FR;
Nanotec Solution, Nimes, FR;
Abstract
A method for measuring axial deviation in a taut-wire alignment system (,) that includes a dynamically grounded resistive wire (,) extending along a longitudinal reference axis and adjacent to elements to be aligned (,). The method comprises applying an AC voltage signal to a measurement electrode provided with a reference electrode, the measurement electrode being arranged in a measurement plane in a holder attached to an element to be aligned (,); carrying out a measurement using a capacitive bridge that includes a first capacitor consisting of the measurement electrode and the wire, as well as a second capacitor, in order to provide a measurement signal representing an axial position of the measurement electrode relative to the taut wire (,) ; and processing the measurement signal to provide data indicating the axial deviation between the element to be aligned (,) and a predetermined alignment position. The method is particularly suitable for aligning elements in linear colliders.