The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2001
Filed:
Nov. 23, 1998
Seiji Sakai, Nagaokakyo, JP;
Abstract
A method of screening varistors. In a first step, a pulse generator is caused to apply to a varistor a large-current pulse having a peak value of at least 1 A and 90% or less of an average breakdown current of the varistor and has a pulse width of 100 msec or less. In a second step, the dielectric loss of the varistor is measured through use of an LCR meter at a frequency of about 100 KHz or higher. Subsequently, in a third step, a judgment is made as to whether the measured value falls within a range that is preset as a reference value for judgment. If the measured value is within the range, the varistor is judged to be a non-defective product. If the measured value is outside of the range, the varistor is judged to be a defective product having an internal defect.