The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2001
Filed:
Oct. 23, 1998
Yoshitaka Suzuki, Okazaki, JP;
Nidek Co., Ltd., Aichi, JP;
Abstract
An apparatus for measuring an optical characteristic of an ablation standard object having a known ablation rate, as compared with an object to be processed having a unknown ablation rate which is ablated with laser beam, the apparatus comprising a retaining device for retaining the ablation standard object so that a surface thereof may be at the predetermined height, a refractive power measuring device for measuring a refractive power of the ablation standard object, which includes a projecting optical system for projecting target luminous flux for use in refractive power measurement onto the ablation standard object retained by the retaining device and a detecting optical system for detecting the target luminous flux projected by the projecting optical system, a moving device for moving the refractive power measuring device to the predetermined measuring position in order to measure the refractive power of the ablation standard object, and an output device for outputting results measured by the refractive power measuring device.