The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2001

Filed:

Jul. 16, 1999
Applicant:
Inventors:

Adriano Zanier, Prilly, CH;

Arthur Bovey, Lausanne, CH;

Lucien Borgognon, Morges, CH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 3/18 ;
U.S. Cl.
CPC ...
G01B 3/18 ;
Abstract

The electronic micrometer includes a casing defining at least an internal volume, in which are disposed a sleeve having an at least partially threaded inner surface. A screw is engaged in this sleeve and is able to be put in rotation with respect to the sleeve in such a way as to displace itself along the longitudinal measuring axis (x) of the device. There is a capacitive system of measurement for measuring the relative rotation of the screw with respect to the sleeve and for determining, starting with that measurement, the longitudinal position of the screw. The casing comprises two half-shells. At least one filiform joint allows the internal volume inside the casing to be sealed. Other sealing means are provided to prevent any infiltration of water or of dust into this internal volume. Accordingly, micrometer are protected.


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