The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2001

Filed:

Jan. 09, 1995
Applicant:
Inventors:

Kenneth P. Parker, Fort Collins, CO (US);

Stig Oresjo, Loveland, CO (US);

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/128 ; G06F 1/100 ;
U.S. Cl.
CPC ...
G01R 3/128 ; G06F 1/100 ;
Abstract

The invention is a method for assuring the integrity of a mission test. The method includes the steps of checking the integrity of the test after test execution but prior to test diagnosis. In particular, after the mission test has been executed, the integrity of the mission test is confirmed based on a comparison of the actual length of the scan path with an expected length of the scan path.


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