The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2001

Filed:

Oct. 01, 1997
Applicant:
Inventors:

Ji-hwan Liu, Cupertino, CA (US);

Ken Nguyen, San Jose, CA (US);

Karl Johnson, Palo Alto, CA (US);

Assignee:

Micron Electronics, Inc., Nampa, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/134 ;
U.S. Cl.
CPC ...
G06F 1/134 ;
Abstract

A method of reporting a system failure in a server system, which includes the following acts: detecting a system failure condition; transmitting failure information related to the failure condition to a system recorder; storing the failure information into a system log; sending an event signal to a system interface; and reporting an occurrence of an event to a central processing unit of the server system.


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