The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2001

Filed:

Sep. 17, 1998
Applicant:
Inventors:

Shigenori Enokido, Tokyo, JP;

Isami Kawabata, Tokyo, JP;

Hiromi Akuta, Tokyo, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/1263 ;
U.S. Cl.
CPC ...
G06F 1/1263 ;
Abstract

A test specification generation system which utilizes a repository of design information entered in a design process so as to enhance operational efficiency of a testing process. A data analysis device reads statements written in the test configuration file, line by line, to thereby determine whether a read statement line is a fixed output line or a program output line. A test item determination device determines whether generation of a test item requires design information alone or not only the design information but also information from a standard test item file stored in a standard test item storage device. A first test item generation device generates test items based on information that the design information reading device obtained from tables of the design information, while a second test item generation device generates test items from the tables and the standard test item file. A test specification writing device outputs fixed output lines and test items generated by the first test item generation device and the second test item generation device, to generate a test specification file.


Find Patent Forward Citations

Enokido, Shigenori. (2001). Test specification generation system and storage medium storing a test specification generation program (U.S. Patent No. 6243835). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6243835

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