The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2001
Filed:
Jun. 30, 1998
Applicant:
Inventor:
William F. Renner, Jr., Baltimore, MD (US);
Assignee:
Digi-Data Corporation, Jessup, MD (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05K 1/000 ;
U.S. Cl.
CPC ...
H05K 1/000 ;
Abstract
This invention is a software-based method for facilitating the recovery of a RAID storage system from the simultaneous failure of two or more disks (catastrophic failure). It involves the identification of the logical address and length of the failed areas of the failed disks and the writing of this information into a bad region table which is replicated on each disk. This makes it easier and less expensive to identify the problem areas and make the necessary repairs.
Quick Actions:
Renner, Jr., William. (2001). Multiple-channel failure detection in raid systems (U.S. Patent No. 6243827). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6243827
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile