The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2001
Filed:
Dec. 31, 1997
Ramakrishna Desiraju, Chappaqua, NY (US);
Omer Bakkalbasi, Mahopac, NY (US);
Bor-Ruey Fu, Ossining, NY (US);
Ray Krasinski, Ossining, NY (US);
Philips Electronics North America Corporation, New York, NY (US);
Abstract
An N-dimensional material planning method for evaluating supplier material policy includes steps for storing supplier characterization data in a N-dimensional data space, and evaluating the supplier characterization data using predetermined rules to thereby generate at least one of a current policy assessment and a recommended policy goal. Moreover, the method includes a further step for analyzing the predetermined rules upon which the at least one of the current policy assessment and the recommended policy goal are based. According to an aspect of the present invention, the evaluating step uses predetermined rules including binary rules and weighting rules to generate the at least one of the current policy assessment and the recommended policy goal, where the binary rules have precedence over the weighting rules. A computer system and a storage medium for carrying out and storing computer readable instructions, respectively, pertaining to the N-dimensional material planning method are also described.