The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2001

Filed:

Dec. 27, 1999
Applicant:
Inventors:

Evan Lee Goldstein, Princeton, NJ (US);

Lih-Yuan Lin, Middletown, NJ (US);

Leda Maria Lunardi, Marlboro, NJ (US);

Assignee:

AT&T Corp., New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/12 ;
U.S. Cl.
CPC ...
G02B 6/12 ;
Abstract

Integrated connection-verification system for use in a micro-electro-mechanical system (MEMS) crossconnect device. The system uses application of a dithering signal such as a sinusoidal bias to an electrode plate associated with a micro-mirror switching element to dither the micro-mirror. The optical signal from the dithering micro-mirror is fed through a beam splitter, a portion of the optical signal thus being directed to a photodetector. If intensity modulation in the optical signal corresponding to the frequency of the dithering signal is detected by the photodetector associated with the micro-mirror, the connection path between the desired input and output ports is verified.


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