The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2001
Filed:
Apr. 01, 1999
Donald G. Heflinger, Torrance, CA (US);
Lee O. Heflinger, Torrance, CA (US);
TRW Inc., Redondo Beach, CA (US);
Abstract
A dynamic optical micrometer for measuring the position of a moving object is invented. The optical micrometer includes a laser for generating an optical signal, an RF signal generator, an acousto-optic modulator that is responsive to the optical signal and the RF signal and is operative to provide a first light beam and a second light beam that is up shifted in frequency by the RF frequency, an optical interferometer that reflects the first beam off the object and interferometrically combines the reflected light beam and the second light beam into a heterodyned signal, means responsive to the heterodyned signal and operative to produce an electrical signal at the optical beat frequency corresponding to the RF and means responsive to the RF signal and the electrical signal and operative to provide a linear output signal that corresponds to the position of the object. A method for accomplishing the same is also invented.