The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2001
Filed:
Dec. 22, 1998
Luigi d'Auria, Sceaux, FR;
Jean Chazelas, Paris, FR;
Jean-Charles Renaud, St Cheron, FR;
Maxime Lailler, St Remy l'Honore, FR;
Thomson-CSF, Paris, FR;
Abstract
This optoelectronic system for the testing of a main antenna comprises: a test antenna designed to be placed in the field of transmission or reception of the main antenna; an optoelectronic component associated with the test antenna alternatively receiving and sending optical signals from/to remote transmitters/receivers and receiving and/or sending optical signals from/to the test antenna; an electric matching circuit connected between the optoelectronic component and the test antenna. This system thus enables the testing on the spot of an antenna (for example a radar antenna) without disturbing the radiation pattern of this antenna. This semiconductor component is therefore alternatively a modulator or a detector of light radiation, and it is connected by optical fibers to emitters and adapted detectors located out of the field of the antennas to be tested. The cables formed by dielectric materials do not disturb the radiation pattern of the antennas. An optoelectronic system is used to overcome the variations in the characteristics of the semiconductor component, thus averting especially a temperature stabilization of this component.