The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2001

Filed:

May. 06, 1999
Applicant:
Inventors:

Hi Deok Lee, Cheongju, KR;

Dae Mann Kim, Pohang, KR;

Sang Gi Lee, Cheongju, KR;

Myoung Jun Jang, Wonju, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/126 ;
U.S. Cl.
CPC ...
G01R 3/126 ;
Abstract

A hot carrier measuring circuit of the present invention, which measures the characteristic degradation of a semiconductor device due to AC operation, includes a pulse generator generating at least two pulse signals which are partially overlapped with each other and have various duty ratios, a level shifter shifting the pulse signal which are generated in the pulse generator to a desired voltage level, and a measuring device receiving the pulse signals outputted from the level shifter to at least one terminal thereof.


Find Patent Forward Citations

Lee, Hi. (2001). Hot carrier measuring circuit (U.S. Patent No. 6242937). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6242937

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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