The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2001
Filed:
Mar. 12, 1999
Michael Joseph Schutten, Schenectady, NY (US);
William George Earls, Schenectady, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
Non-destructive EMI susceptibility testing involves near-field injection of very high levels of instantaneous energy and low average power through localized injection of signals of very high field strength and low duty cycle. An electric field injector and a magnetic field injector are scanned, each in turn, over the equipment under test. For each injector, the amplitude and frequency of the induced localized electric or magnetic field, respectively, is varied such that the susceptibility locations, magnitudes, and frequencies can be identified and mapped. This approach localizes which section or subcircuit of the equipment under test is susceptible, the frequencies and field strengths of susceptibility, and whether susceptibility problems are created by magnetic fields, electric fields, or both.