The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2001

Filed:

Jan. 11, 1999
Applicant:
Inventors:

Jean-Claude Geay, Montign y le Bretonneux, FR;

Jean Treillet, Boulogne Billancourt, FR;

Bernard Beaumesnil, Le Mans, FR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/161 ;
U.S. Cl.
CPC ...
G01T 1/161 ;
Abstract

An articulation system that allows for the rotation of a TAC device of a dual detector scintigraphy camera in two successive positions, perpendicular and opposite, in order to make it possible to use the TAC device either with perpendicular detectors or with parallel detectors. This articulation system contains a joint face at a 45° angle in relation to the longitudinal axis of a support so that the TAC device can take on two positions, perpendicular and opposite, where passage from one position to the other is obtained by a 180° rotation in relation to the axis of this joint face.


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